STUDY ON CRYSTAL LATTICE DEFECT BY THE X-RAY DIFFRACTION TOPOGRAPHY - Collections

＜departmental bulletin paper＞
STUDY ON CRYSTAL LATTICE DEFECT BY THE X-RAY DIFFRACTION TOPOGRAPHY

Creator	Author PID 60038536 Creator Name FUTAGAMI, Koji 二神, 光次フタガミ, コウジ Affiliation Affiliation Name Research Institute for Applied Mechanics, Kyushu University : Associate Professor 九州大学応用力学研究所 : 助教授
Language	English
Publisher	Research Institute for Applied Mechanics, Kyushu University
Publisher	九州大学応用力学研究所
Date	1969
Source Title	Reports of Research Institute for Applied Mechanics
Vol	17
Issue	57
First Page	49
Last Page	122
Publication Type	Version of Record
Access Rights	open access
Table of Contents	I. Study of the x-ray diffraction topography 　1. Introduction 2. Principle of x-ray diffraction topography and its principal techniques 3. Characteristic features of x-ray diffraction topography used in the present study 4. The limited projection topography 5. The small width x-ray beam method 6. The modified Berg-Barrett method 7. The x-ray small angular oscillation method 　Ⅱ Study of lattice defects by x-ray diffraction topography 1. Introduction 2. The state of lattice defects in LiF single crystal grown by solidification 3. Lattice defect of LiF single crystal subjected to plastic deformation 4. Observations of lattice defects in LiF single crystal due to annealing 5. Lattice defects appearing on the cleavage surface of LiF single crystal 6. Lattice defects in LiF single crystal irradiated by radioactive rays 7. Lattice defects originated x-ray diffraction spikes of diamondshow more

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