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＜紀要論文＞
STUDY ON CRYSTAL LATTICE DEFECT BY THE X-RAY DIFFRACTION TOPOGRAPHY
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| 目次 | I. Study of the x-ray diffraction topography 1. Introduction 2. Principle of x-ray diffraction topography and its principal techniques 3. Characteristic features of x-ray diffraction topography used in the present study 4. The limited projection topography 5. The small width x-ray beam method 6. The modified Berg-Barrett method 7. The x-ray small angular oscillation method Ⅱ Study of lattice defects by x-ray diffraction topography 1. Introduction 2. The state of lattice defects in LiF single crystal grown by solidification 3. Lattice defect of LiF single crystal subjected to plastic deformation 4. Observations of lattice defects in LiF single crystal due to annealing 5. Lattice defects appearing on the cleavage surface of LiF single crystal 6. Lattice defects in LiF single crystal irradiated by radioactive rays 7. Lattice defects originated x-ray diffraction spikes of diamond続きを見る |
詳細
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| 登録日 | 2024.03.12 |
| 更新日 | 2024.04.19 |